Individual testing for individual electronics
We develop and build special test equipment and we also program the appropriate test software. This way, we can focus on and address the requirements of your applications directly.
Test development refers to many testing operations:
- System configuration, programming, parameterisation
- In-circuit testing (ICT)
- Functional testing (FCT)
- Run-in testing - reliability of the assembly
- Burn-in testing - aging simulation of the assembly
- Boundary-scan testing - standard method to check digital and analogue elements
- Automatic optical inspection (AOI)
- Automatic X-ray inspection (AXI)
Ask us about the right testing strategy for your electronics application.